Tokyo, Japan - September 14, 2012
Yokogawa Electric Corporation announces that it will release a multi-DUT* test system for high-brightness light-emitting diodes (LEDs) on October 1. Jointly developed with SUN-S Co., Ltd., this system can simultaneously measure the optical and electrical characteristics of four LEDs, shortening the test time by 60% compared to conventional DUT test systems that can test only one device at a time. This will dramatically reduce test costs.
This system will be exhibited at the LED Japan Conference & Expo/Strategies in Light, which will be held at the Pacifico Yokohama convention center from September 25 to 27.
* DUT: Device under test
Multi-DUT Test System for High-brightness LEDs
Development Background
The market for long-life, low power consumption LED lights is rapidly expanding due to increasing awareness of the need for energy saving. As many companies enter the market, prices are falling and thus LED chip manufacturers are working hard to cut costs and improve test efficiency to enhance competitiveness. They need to improve throughput by increasing the number of LEDs that can be tested at one time, a task that is difficult due to the probing scheme requirements of LED chips.
This multi-DUT test system for high-brightness LEDs has been made possible by the combination of Yokogawa's high-speed spectrometry measuring technology and SUN-S's expertise in semiconductor manufacturing equipment.
Configuration of the Test System
Yokogawa has developed the SP1000 spectrometer for measuring optical characteristics and the FS-18V/50V source measurement measure unit that measures electrical characteristics, supplies a drive current, and outputs test signals, while SUN-S has developed a prober that comes into contact with LED chips and feeds them electric current through contact needles. This system includes automatic test control software and a PC that serves as the human machine interface (HMI) for test operation and engineering. This is a turnkey test system solution for high-brightness LEDs.
Configuration of the Test System
Product Features
- Simultaneous testing of four LEDs
This feature shortens the test time by 60% compared to conventional systems that test LEDs one at a time. This greatly reduces costs. - Fast, reliable, repeatable
Yokogawa's high-speed SP1000 spectrometer operates in sync with the trigger input from the FS-18V/50V source measure unit, enabling it to quickly measure the optical characteristics of LEDs. This minimizes both the measuring time and the amount of heat generated by the DUT. This system has been designed also to be highly resistant to changes in the ambient temperature, thus guaranteeing highly repeatable, stable test results.
Major Target Markets
LED chip manufacturers, testing companies, and packaging companies
Applications
Testing of wafers and diced chips, final testing after packaging, and other processes including research, development, evaluation, and quality assurance for LEDs
About Yokogawa
Yokogawa's global network of 90 companies spans 55 countries. Founded in 1915, the US$4 billion company conducts cutting-edge research and innovation. Yokogawa is engaged in the industrial automation and control (IA), test and measurement, and other businesses segments. The IA segment plays a vital role in a wide range of industries including oil, chemicals, natural gas, power, iron and steel, pulp and paper, pharmaceuticals, and food. For more information about Yokogawa, please visit the website www.yokogawa.com
About SUN-S
SUN-S has expanded its business domain from the fabric business in 1932 to the electronics business in 1970 and the SHE care business in 1994, and supports diverse products and fields. Towards a future expansion of its own business fields, SUN-S continues to challenge new fields adopting the key phase "T.T.S makes the future" whose basic concept is "Textiles" wrap and protect humanity. "Technology" benefits and invigorates humanity, and "Science" encourages and develops humanity. Please visit the website www.sun-s.jp/global