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LSI Test Systems
LSI Test Systems
Test Systems for System-on-a-Chip
Test Systems for System-on-a-Chip
Memory Test Systems
Memory Test Systems
STIL-compatible Open Plug-in Platform, STIL-TestHighway™
STIL-TestHighway™
New Value-added Workflow in LSI Design and Test Environments
Deployment effects of PreTestStation™
PreTestStation™
Allows Early-stage Test Program Verification
Test Program Checker
Test Program Checker
Improves Test Program Quality Prior to Testing of Actual Device
Offices
Offices

Japan
Yokogawa Electric Corporation, ATE Business Division
2-9-32 Nakacho, Musashino-shi, Tokyo 180-8750, Japan
Tel: 81-422-52-9700 Fax: 81-422-52-2159
e-mail: tester_p@csv.yokogawa.co.jp

Korea
Yokogawa Measuring Instruments Korea Corporation
Rm. 405-9, City Air Terminal Bldg., #159-6 Samsung-dong, Kangnam-ku, Seoul, Korea
Tel: 82-2-551-0660 Fax: 82-2-551-0665

Singapore
Yokogawa Engineering Asia Pte Ltd., Response Centre
5 Bedok South Road, Singapore 469270
Tel: 65-2493632 Fax: 65-2418885

USA
Yokogawa Corporation of America, ATE Department
3600 Madison Avenue, suite 58, North Highlands, CA 95660, USA
Tel: 1-916-348-9086 , Fax: 1-916-348-6727
e-mail: ATE@us.yokogawa.com

Taiwan
Yokogawa Testing Technologies
2F-9,No.38,Tai Yuen Street, Tai Yuen Hi-Tech Industrial Park, ChuPei City,HsinChu Hsien,302,Taiwan
Tel: 886-3-5600658 FAX:886-3-6003829

China
Yokogawa China Co., Ltd., ATE Center
NO.23 Building No.115 Lane 572 Bibo Road Zhangjiang Hi-Tech Park, Shanghai China ZIP:201203
Tel: 86-21-5080-9848 Fax: 86-21-5080-9846
e-mail: ATE@gr.cn.yokogawa.com

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