Recently, CMOS image sensors with high image quality and high-speed operation are attracting increasing attention, and are now widely used for not only cellular phone cameras but also high-end digital still cameras. The requirement of higher image quality drives the need for an advanced capability to test for blotches and ununiformities, which is beyond the capabilities of conventional testers. The next-generation UE600 test system has been developed for use with CMOS image sensors, and has a powerful built-in image processing engine and 16-DUT parallel test capability.