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Mobile Communications IC Test System TS6900S
The best solution for next-generation RF devices
TS6900

The TS6900S is an RF mixed IC test system that improves measurement throughput and reduces the cost of RF chipsets for mobile communication consoles such as 3.5-generation mobile phones, One-Seg mobile phones, WiMAX, and the like.

Equipped with an RF signal generator and measuring circuit developed specifically for this test system
Wide-band waveform generator, digitizer
Flexible DSP computation
Capable of testing A/D mixed devices
Target devices:
RF transceiver such as cellular phones, GPS, One-Seg mobile phones, mobile WiMAX, lowpower wireless and the like.
Main specifications:
RF Source (SHFS)
Number of channels: 2
Frequency range: 250 kHz to 3 GHz
Output level:-110 dBm to +10 dBm
SSB phase noise: -124 dBc/Hz typ.
                 (at 2GHz, 20 kHz offset)
RF Measurement (SHFM)
Number of channels: 1
Frequency range: 100 Hz to 3 GHz
Measurement range:
                -20 to +20 dBm(10 dB step)
Resolution bandwidth (RBW):
                1 Hz, 3 Hz to 1 MHz, 3 MHz,
                10 MHz(1-3 step)
Test example:
Gain /Carrier leak /IIP2,IIP3,OIP3
/Linearity Isolation /IQ phase amplitude error, error /ACLR,EVM /Spurious /CN
/BER  
GLOBAL  
YOKOGAWA

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