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High Cost Performance · Simultaneous Testing of Two Device Types |
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(1) In a single test head configuration, parallel measurement of up to 512 memory devices is possible. |
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(2) In a double test head configuration, throughput is drastically improved as the test heads operate independently and can simultaneously test two different device types. |
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Package Testing for All Memory Device Types |
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For DRAM, SRAM, PSRAM, Flash, MCP (Multi Chip Package) and ASIC with memory |
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(2) For wafer and KGD (Known Good Die) tests |
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Reduced Footprint |
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Thanks to its newly developed multi-function test station, the MT6121 uses just 60% the floor space of previous Yokogawa testers. |
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User Friendly |
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The AViPS™ user interface reduces both development and evaluation time. |
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| Maximum test frequency: |
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280 MHz/560 Mbps |
| Parallel measurement: |
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128 devices (x 18 bit devices)
256 devices (x 9 bit devices)
512 devices (x 9 bit devices with compressed common DRV, IO mode.) |
| Test head: |
2 units or 1 unit |
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