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High Cost Performance · Simultaneous Testing of Two Device Types |
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(1) Drastically improved throughput as
each test head operates
independently and can test a
maximum of 512 memory devices |
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(2) Capable of simultaneously testing
two device types |
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Wafer Testing for All Memory Device Types |
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(1) For DRAM, SRAM, PSRAM, Flash, and
ASIC with memory |
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(2) For wafer and KGD (Known Good
Die) tests |
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Reduced Footprint |
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Thanks to its newly developed multi-function test station, the MT6121 uses just 60% the floor space of previous Yokogawa testers. |
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User Friendly |
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The AViPS™ user interface reduces both development and evaluation time. |
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| Maximum test frequency: |
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280 MHz/560 Mbps |
| Parallel measurement: |
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128 devices (x 18 bit devices)
256 devices (x 9 bit devices)
512 devices (x 9 bit devices with compressed common DRV, IO mode.) |
| Test head: |
2 units or 1 unit |
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